Rapid Fitting of Band-Excitation Piezoresponse Force Microscopy Using Physics Constrained Unsupervised Neural Networks

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Alibek T. Kaliyev^1,2, Ryan Forelli⁵, Pedro Sales⁷, Shuyu Qin¹, Yichen Guo³, Olugbodi (FJ) Oluwafolajinmi⁵, Seda Ogrenci Memik¹², Michael W. Mahoney¹¹, Amir Gholami¹¹, Rama K. Vasudevan⁹, Stephen Jesse⁹, Nhan Tran¹⁰, Philip Harris⁸, Martin Takáč⁴, Joshua C. Agar^6*

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¹ Department of Computer Science and Engineering, Lehigh University, Bethlehem, Pennsylvania

² College of Business, Lehigh University, Bethlehem, Pennsylvania

³ Department of Materials Science and Engineering, Lehigh University, Bethlehem, Pennsylvania

⁴ Department of Industrial and Systems Engineering, Lehigh University, Bethlehem, Pennsylvania

⁵ Department of Electrical and Computer Engineering, Lehigh University, Bethlehem, Pennsylvania

⁶ Department of Mechanical Engineering and Mechanics, Drexel University, Philadelphia, Pennsylvania

⁷ Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology (MIT), Cambridge, Massachusetts

⁸ Department of Physics, Massachusetts Institute of Technology (MIT), Cambridge, Massachusetts

⁹ Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee

¹⁰ Fermi National Accelerator Laboratory, Batavia, Illinois

¹¹ Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, Berkeley, California

¹² Department of Electrical and Computer Engineering, Northwestern University, Illinois

*Address correspondence to: [email protected]